CODA-PIN Contact Probes & Interfacing Components

ATE Test Probes

ATE Test Probes • PA4 & ST-PA4 Series • LPC1 & ST-LPC1 Series •

ST-PA4QPE-040 - PLAIN CROWN Extra heavy spring STEEL

2.54mm / 0.10" centres

The PA4 series is the universal choice for use in the majority of ATE test fixtures and has a very wide range of tip styles for most test applications. Additionally, a choice of up to six spring forces is offered. Many of these tip styles now incorporate ECT's PogoPlus bias ball technology which will guarantee an uninterrupted internal contact with a consistently low resistance figure; typically 8më. This virtually eliminates probe related false opens, an important issue in today's tough test environment and allows high current capability from a standard product. The ST-PA4 series has special hard steel tips which ensure an exceptional resistance to wear on the faces. This enables good penetration of any residual contaminants on test surfaces, particularly for lead-free solders. Please see our lead-free section.

Specification Full travel 6.35mm (.250") Working travel 4.24mm (.167") Spring force at wkg travel 'L' Extra light spring 57g (2.0oz) 'S' Light spring 114g (4.0oz) 'X' Heavy spring 170g (6.0oz) 'E' Extra heavy 227g (8.0oz) 'U' Ultra heavy spring 283g (10.0oz) 'W' Ultra heavy spring 350g (12.0oz) Current rating DC cont shown with tip style Minimum test centres 2.54mm (.100")   Assembly information