Interfacing Components General Purpose Test Probes

ATE Test Probes -

PA4AL - CONCAVE HEAD Extra light spring

2.54mm / 0.10" test centres

The PA4 Series is the universal size for use at 2.54mm test centres in the majority of ATE test fixtures. It has a very wide range of tip styles for almost all test targets. Additionally, a wide choice of spring forces is available. The ST-PA4 series adds hardened steel tips which ensure an exceptional resistance to wear in high volume PCB production runs. The LF-PA4 series has hardened tips, extra resilient plated surfaces and an enhanced pre-loaded spring pressure to enable good penetration of the tough residual contamination often found on the surface of many lead-free solders.

Test Probe Specification

Full travel	6.35mm (.250")
Working travel	4.24mm (.167")
Spring force	at wkg travel
'L' Extra light spring	57g (2.0oz)
'S' Light spring	114g (4.0oz)
'X' Heavy spring	170g (6.0oz)
'E' Extra heavy	227g (8.0oz)
'U' Ultra heavy spring	283g (10.0oz)
'W' Ultra heavy spring	350g (12.0oz)
Current rating DC (max)	cont shown with tip style
Minimum test centres	2.54mm (.100")