The three series of probes and receptacles below are the standard choice for use in vacuum or pneumatically operated test fixtures, which are used with automatic test systems (ATE). They are also commonly used for simple bench-top jigs and repair stations.
We stock a wide range of tip-styles for each of the three series. Most types of PCB test positions can be probed. Most tip-styles can now be upgraded to hardened steel tips (prefix ‘ST’) to meet the tough demands of high volume production runs or for new solder types.
The two-part assembly allows easy replacement of worn or damaged probes.

Within each series is a selection of probes for use with lead free solders. These have proven to be successful in restoring first time pass ratios during the transition over to lead-free and then onwards. The steel super-sharp blades, together with elevated spring forces, have allowed testing to resume, after a re-pinning exercise.

Vectorless test technology is used in some ATE test fixtures to sense manufacturing defects in relation to component placement and functionality. They are replaceable almost as simply as normal test probes, if damage or failure occurs.   
Insulated head probes are used for circuit board component lead or pin detection prior to testing.

Twist action probes are used in applications where conventional ATE probes are failing to pierce severe contamination, such as conformally coated PCBs. Contact reliability can be restored.

ATE travel indicator probes are designed to measure the travel at any probe position in a test fixture.